<?xml version='1.0' encoding='UTF-8'?><metadata xmlns:xsi="http://www.w3.org/2001/XMLSchema-instance" xmlns:dc="http://purl.org/dc/elements/1.1/" xmlns:dcterms="http://purl.org/dc/terms/" xmlns="http://dublincore.org/documents/dcmi-terms/"><dcterms:title>Supplementary Data for: Optimization of grayscale lithography for the fabrication of Flat Diffractive Infrared Lenses on Silicon Wafers</dcterms:title><dcterms:identifier>https://doi.org/10.23642/USN.26130904</dcterms:identifier><dcterms:creator>Bouchouri Angelos</dcterms:creator><dcterms:publisher>DataverseNO</dcterms:publisher><dcterms:issued>2024-07-03</dcterms:issued><dcterms:modified>2025-12-22T12:47:57Z</dcterms:modified><dcterms:description>DATASET MIGRATED FROM FIGSHARE: &lt;p dir="ltr">Images and data acquired during the experiment and presented in the article.&lt;/p></dcterms:description><dcterms:subject>Other</dcterms:subject><dcterms:subject>grayscale lithography</dcterms:subject><dcterms:subject>infrared imaging systems</dcterms:subject><dcterms:subject>fresnel lenses</dcterms:subject><dcterms:subject>reactive ion etching conditions</dcterms:subject><dcterms:IsSupplementTo>Optimization of Grayscale Lithography for the Fabrication of Flat Diffractive Infrared Lenses on Silicon Wafers, doi, 10.3390/mi15070866, https://doi.org/10.3390/mi15070866</dcterms:IsSupplementTo><dcterms:date>2024-07-03</dcterms:date><dcterms:contributor>University of South-Eastern Norway</dcterms:contributor><dcterms:dateSubmitted>2024-07-03</dcterms:dateSubmitted><dcterms:license>CC BY 4.0</dcterms:license></metadata>